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TS-60 Thermal Shock Test Chamber

The TS-60 small thermal shock test chamber is ideal for the testing of IC chips and small electronics. Design is constructed of two independently controlled chambers. One chamber is hot and the other one is cold. Product is rapidly transferred between the hot and cold chamber creating a temperature shock of the specimens. The TS Series thermal shock test chamber is the right solution for all your thermal shock testing requirements. These thermal shock chambers meet a variety of test specifications including Mil-Std 810, Mil-Std 883, IEC 60068-2-14, JEDEC and a variety of commercial test standards.

These TS Series Thermal Shock chambers are also in stock! click here.

  • Small Footprint
  • Energy-saving design
  • Quiet Operation at 58 dB(A)
  • More than 1,000 cycles without defrosting
  • The innovative WEBSeason® user interface allows you to program, control and monitor your tests at anytime and anywhere – even from your tablet or smartphone

Specifications

 

ModelTS 60
Test Space Volume
(Cu.Ft/Liters)
2.1/60
Temperature RangeHot Chamber: +50°C to +220°C

Cold Chamber: -80°C to +70°C

External Width35.2″ (895mm)
External Depth77.5″ (1970mm)
External Height74.6″ (1895mm)

 

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